发明名称 Process of manufacturing semiconductor device
摘要 A process of manufacturing a semiconductor device having a dual gate CMOS transistor in which an nMOS transistor in the dual gate CMOS transistor is formed by the steps of: (a) forming a gate insulating film and a silicon film on a semiconductor substrate; (b) implanting n-type impurities into the silicon film in an nMOS region of the semiconductor substrate; (c) forming a conductive film on the silicon film; and (d) patterning the silicon film and the conductive film into a gate electrode.
申请公布号 US2002042173(A1) 申请公布日期 2002.04.11
申请号 US20010829068 申请日期 2001.04.10
申请人 TAKAMURA YOSHIJI 发明人 TAKAMURA YOSHIJI
分类号 H01L21/28;H01L21/336;H01L21/8238;H01L27/092;(IPC1-7):H01L21/823 主分类号 H01L21/28
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