发明名称 |
ULTRA-SHORT-PULSE ELECTRON DIFFRACTION DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide an ultra-short-pulse electron diffraction device for tracking the change in the molecular structure of a sample in a femtosecond region in real time. SOLUTION: The ultra-short-pulse electron diffraction device comprises an ultra-short-pulse laser beam generation device 1, a cathode 3 where the ultra- short-pulse laser beam is applied from the ultra-short-pulse laser beam generation device 1, an acceleration device 4 for accelerating an electron pulse (e) that is generated from the cathode 3 and obtaining the short electron pulse (e), an interaction region (interaction section) 5 where the short electron pulse (e) is operated on a sample gas 6, and a means for observing an electron diffraction image at the interaction region 5.</p> |
申请公布号 |
JP2002098655(A) |
申请公布日期 |
2002.04.05 |
申请号 |
JP20000289154 |
申请日期 |
2000.09.22 |
申请人 |
JAPAN SCIENCE & TECHNOLOGY CORP |
发明人 |
YAMAUCHI KAORU;HOSHINA KENNOSUKE |
分类号 |
G01N23/20;(IPC1-7):G01N23/20 |
主分类号 |
G01N23/20 |
代理机构 |
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