A METHOD AND AN APPARATUS FOR TESTING ELECTRONIC DEVICES

摘要

An apparatus comprising a body having a first signal line through a first plane of the body and a second signal line through a second plane of the body. A first set of contact elements extend through the body and are coupled to the first signal line. A second set of contact elements extend through the body and are coupled to the second signal lines. The first set of contact elements and the second set of contact elements correspond to a portion of external contact points of an integrated circuit.