发明名称 COLUMN REDUNDANCY REPAIR CIRCUIT
摘要 PURPOSE: A column redundancy repair circuit is provided to improve repair efficiency of a chip by efficiently using a limited redundancy column select signal. CONSTITUTION: The first to n-th address fuse boxes(41-4n) correspond to n redundancy column select signals, respectively. The first to n-th group fuse parts(51-5n) individually determine whether a repair operation is carried out by corresponding address fuse boxes. The first to n-th comparators(61-6n) compare a current column address(CA) with fuse box output signals(FB1-FBn) of the first to n-th address fuse boxes, respectively. A column decoder(7) selectively outputs a main column select signal and a redundancy column select signal in response to output signals(RE1-REn, RCO1-RCOn) from the comparators, and group fuse output signals(GF1-GFn).
申请公布号 KR20020025348(A) 申请公布日期 2002.04.04
申请号 KR20000057075 申请日期 2000.09.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, YONG HWAN
分类号 G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/00
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