发明名称 |
POLISHING APPARATUS FOR HIGH-HARDNESS WAFER |
摘要 |
PURPOSE: A polishing apparatus for a high-hardness wafer is provided to extend a lifetime of a surface plate and to improve polishing efficiency, by changing the structure of the surface plate and by using a simple power transmission structure to prevent the surface plate from being partly worn away. CONSTITUTION: The high-hardness wafer is polished by friction with the surface plate(1) rotating with respect to a rotation axis(3) connected to a motor(2). The surface plate is so formed to protrude that a polishing part(1') in direct contact with the high-hardness wafer has a width not greater than the diameter of the high-hardness wafer. A wafer rotating apparatus rotates at least one high-hardness wafer over the polishing part. A wafer pressuring apparatus pressures the high-hardness wafer to be closely adhered to the polishing part.
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申请公布号 |
KR20020023503(A) |
申请公布日期 |
2002.03.29 |
申请号 |
KR20000055798 |
申请日期 |
2000.09.22 |
申请人 |
KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
EUN, GWANG YONG;LEE, JAE GAP;LEE, TAE GI;PARK, YUN CHANG |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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