发明名称 POLISHING APPARATUS FOR HIGH-HARDNESS WAFER
摘要 PURPOSE: A polishing apparatus for a high-hardness wafer is provided to extend a lifetime of a surface plate and to improve polishing efficiency, by changing the structure of the surface plate and by using a simple power transmission structure to prevent the surface plate from being partly worn away. CONSTITUTION: The high-hardness wafer is polished by friction with the surface plate(1) rotating with respect to a rotation axis(3) connected to a motor(2). The surface plate is so formed to protrude that a polishing part(1') in direct contact with the high-hardness wafer has a width not greater than the diameter of the high-hardness wafer. A wafer rotating apparatus rotates at least one high-hardness wafer over the polishing part. A wafer pressuring apparatus pressures the high-hardness wafer to be closely adhered to the polishing part.
申请公布号 KR20020023503(A) 申请公布日期 2002.03.29
申请号 KR20000055798 申请日期 2000.09.22
申请人 KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 EUN, GWANG YONG;LEE, JAE GAP;LEE, TAE GI;PARK, YUN CHANG
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
代理机构 代理人
主权项
地址