发明名称 |
SEMICONDUCTOR DEVICE, SEMICONDUCTOR SUBSTRATE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a structure of a field effect transistor for realizing an integrated circuit capable of remarkably reducing a power consumption and rapidly operating as compared with an integrated circuit constituted of a conventional Si-MOSFET. SOLUTION: A substrate 5 is obtained by forming an insulating film 2 on a supporting base 1 and laminating an SiGe buffer layer 3 (first semiconductor layer) of a high Ge composition of 30 atm.% or more and a channel layer (second semiconductor layer) made of an SiGe layer containing more Ge than that of the Ge layer or the first semiconductor layer on the film 2. A source region and a drain region 6 are formed on the substrate 5, and connected to a source electrode (not shown) and a drain electrode (not shown), respectively.
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申请公布号 |
JP2002076347(A) |
申请公布日期 |
2002.03.15 |
申请号 |
JP20000254958 |
申请日期 |
2000.08.25 |
申请人 |
TOSHIBA CORP |
发明人 |
TEZUKA TSUTOMU;SUGIYAMA NAOHARU |
分类号 |
H01L27/08;H01L27/12;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L27/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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