发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A SEMICONDUCTOR device and a manufacturing method thereof are provided to solve the problem that driving current does not flow fully because of temperature rise of IC chip at driving. CONSTITUTION: Conducting patterns(11A-11D) are buried in insulating resin(10) to be formed, and a conducting foil(20) is subjected to half etching to be formed, so that thickness of a semiconductor device can be reduced sufficiently. Since an electrode(11D) for heat dissipation is arranged, a semiconductor device excellent in heat dissipating property can be provided. Furthermore, by arranging a solder electrode(11E) for relieving stress, stress generated on external connection electrodes(11C) positioned in peripheral parts can be relieved, and generation of cracks can be prevented.
申请公布号 KR20020020169(A) 申请公布日期 2002.03.14
申请号 KR20010009507 申请日期 2001.02.24
申请人 SANYO ELECTRIC CO., LTD. 发明人 IGARASHI YUSUKE;KOBAYASHI YOSHIYUKI;MAEHARA EIJU;OKADA YUKIO;SAKAMOTO JUNJI;SAKAMOTO NORIAKI;TAKAHASHI KOUJI
分类号 H01L23/36;H01L21/48;H01L23/31;H01L23/495 主分类号 H01L23/36
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