发明名称 |
Light projecting method, surface inspection method, and apparatus used to implement these methods |
摘要 |
The present invention provides a light illuminating method, a surface examining method using the light illuminating method, and apparatuses for performing these methods. In the surface illuminating apparatus for illuminating an object with a light beam from a light source through a lens member for illumination, the lens member for illumination has a characteristics with respect to a longitudinal aberration caused by a spherical aberration in the light source side of the lens for illumination, that an amount of shift from a paraxial image surface to image formation points gradually increase or decrease, with an increase in height of light incidence into the lens; and the light source is set at a position in an outside of a group of the image formation points.
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申请公布号 |
US6356399(B1) |
申请公布日期 |
2002.03.12 |
申请号 |
US20000463656 |
申请日期 |
2000.05.05 |
申请人 |
NEWCREATION CO., LTD. |
发明人 |
HAGA KAZUMI;SAKAI MOTOSHI;USHIYAMA ZENTA |
分类号 |
F21V5/04;G01B11/255;G01B11/30;G01M11/00;G01N21/88;G02B19/00;G02B21/06;G02B27/00;(IPC1-7):G02B27/02;G01N21/55 |
主分类号 |
F21V5/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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