发明名称 THERMAL ANALYZER, THERMAL ANALYSING MEASURING METHOD, AND GAS FLOW UNIT
摘要 PROBLEM TO BE SOLVED: To perform highly reliable measurement by preventing variations in internal pressure from being produced within a sample chamber in a thermal analyzer for measuring by setting the concentration of oxygen low around a sample by forming separate gas flows within the sample chamber. SOLUTION: This thermal analyzer has a first opening 01 formed in the sample chamber 2 for disposing the sample S therein and a gas supply port 13 for supplying gas to the sample chamber 2. The thermal analyzer further has a second opening 02 provided on the opposite side to the first opening 01 relative to the position where the sample S is disposed and a gas carrying pump 23 connected to the second opening 02. By sucking the gas by the carrying pump 23, the inert gas taken in from the supply port 13 is made to flow, within the sample chamber 2, separately in the direction of the first opening 01 and in the direction of the second opening 02. The first opening 01 is open to the exterior and the interior of the sample chamber 2 is kept at the external pressure at all times.
申请公布号 JP2002071603(A) 申请公布日期 2002.03.12
申请号 JP20000255008 申请日期 2000.08.25
申请人 RIGAKU CORP 发明人 TAKADA YOSHIHIRO
分类号 G01N25/20;G01N5/04;(IPC1-7):G01N25/20 主分类号 G01N25/20
代理机构 代理人
主权项
地址