发明名称 |
MEASURING THE WALL THICKNESS OF AN ELECTRICALLY CONDUCTIVE OBJECT |
摘要 |
Measuring the wall thickness of an electrically conductive object (2) using a probe (4) comprising a transmitter coil (6), a first receiver (8) and a second receiver (10), which method comprises arranging the probe (4) near the object (2); inducing transient eddy currents in the object (2) and recording the signals of the receivers with time; measuring the wall thickness from a characteristic of one of the signals; calculating a characteristic value from a combination of the signals; and correcting the measured wall thickness for the distance between the probe (4) and the object (2) using a pre-determined relationship between the wall thickness and the characteristic value for different values of the distance between the probe (4) and the object (2).
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申请公布号 |
WO0216863(A1) |
申请公布日期 |
2002.02.28 |
申请号 |
WO2001EP09720 |
申请日期 |
2001.08.22 |
申请人 |
SHELL INTERNATIONALE RESEARCH MAATSCHAPPIJ B.V. |
发明人 |
CROUZEN, PAULUS, CAROLUS, NIC;VAN DER STEEN, JOHAN;LOOIJER, MARK, THEODOOR |
分类号 |
G01B7/00;G01B;G01B7/02;G01B7/06;G01R35/00;(IPC1-7):G01B7/02 |
主分类号 |
G01B7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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