IMAGE SENSOR FOR DEFECTIVE PIXEL CONCEALMENT

摘要

PURPOSE: An image sensor is provided to conceal the defective pixels in an easy manner by using addresses of the pixels which are recorded into a chip through a fuse on/off method. CONSTITUTION: An image sensor includes a pixel array(10) which is arrayed in unit pixels of N(number of columns) x M(number of lines), so as to sense the information of the image applied from an external source; and a fuse block(18) for recording, in a laser blowing method, the address of defective pixels from among the pixel array, detected during the wafer test of the image sensor. The image sensor performs concealing operation for the relevant defective pixel, in response to the defective pixel address recorded in the fuse unit. The fuse unit has a size determined by the chip designer in response to the yield rate of the chip of the image sensor.