发明名称 Scan head, an appearance inspection method and an appearance inspection apparatus using the same
摘要 An appearance inspection apparatus for inspecting a surface of a printed circuit board requires high inspection accuracy and inspection time reduction. To this end, the apparatus has a scan head that scans an object under inspection and generates image data of the surface of the object. The scan head includes a vertical light source which projects light on the surface from right above the object and a side light source which projects light sidelong on the surface. A lenticular sheet is provided between the vertical light source and the object in order to adjust the vertical light and improve the inspection accuracy in a vertical light test. In a side light test, light sources other than the central part in the vertical light source is turned on and an auxiliary light is projected along with the side light, so that the dynamic range for the inspection can increase.
申请公布号 US2002021496(A1) 申请公布日期 2002.02.21
申请号 US20010790671 申请日期 2001.02.23
申请人 AKIYAMA YOSHIHIRO;IWANO YUKIO 发明人 AKIYAMA YOSHIHIRO;IWANO YUKIO
分类号 G01N21/956;G02B26/10;G06T1/00;(IPC1-7):G02B27/10 主分类号 G01N21/956
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