发明名称 A METHOD FOR PATTERNING LAYERS OF SEMICONDUCTOR DEVICES
摘要 In a method for patterning layers of semiconductor devices, starting with a substrate with an Al-layer (6) (or Al alloy) and a layer of TiN (4) (or Ti (5)), the layer of TiN (4) is selectively etched with a chemistry comprising CF4 and Cl2.
申请公布号 WO0215231(A2) 申请公布日期 2002.02.21
申请号 WO2001EP09082 申请日期 2001.08.06
申请人 MOTOROLA, INC.;SEMICONDUCTOR 300 GMBH & CO. KG;INFINEON TECHNOLOGIES AG;APPLIED MATERIALS GMBH 发明人 PASCHEDAG, LARS;MC GOWAN, RICKY;GREWAL, VIRINDER;SCHNEIDER, STEFFEN
分类号 H01L21/3213;H01L21/768 主分类号 H01L21/3213
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