发明名称 |
X-ray mask, and exposure method and apparatus using the same |
摘要 |
An X-ray mask has a mask pattern, a protection means for forming a dust-proof space for protecting the mask pattern, and an inner atmospheric pressure adjustment hole for ventilating between the dust-proof space and the outer atmosphere. The X-ray mask can be either a transmission type mask in which the mask pattern is formed on a membrane, or a reflection type mask in which a multilayered film reflection layer and the mask pattern are formed on a substrate.
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申请公布号 |
US2002021781(A1) |
申请公布日期 |
2002.02.21 |
申请号 |
US20010970826 |
申请日期 |
2001.10.05 |
申请人 |
CHIBA KEIKO;TSUKAMOTO MASAMI;WATANABE YUTAKA;HARA SHINICHI;MAEHARA HIROSHI |
发明人 |
CHIBA KEIKO;TSUKAMOTO MASAMI;WATANABE YUTAKA;HARA SHINICHI;MAEHARA HIROSHI |
分类号 |
G03F1/14;G21K3/00;G21K5/00;H01L27/00;(IPC1-7):H01L27/00 |
主分类号 |
G03F1/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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