| 摘要 |
PROBLEM TO BE SOLVED: To improve efficiency in inspection work by providing a chip component measuring jig and an inspecting method capable of shortening the time of transfer to a measuring jig from a tray on which components prior to inspections are arranged and losses of time in transfer from the measuring jig to classification trays in the case of using a conventional chip component measuring jig. SOLUTION: The movable-type chip component measuring jig is provided with a suction hole at a center part and a measuring terminal suitable for chip components at the outer circumferential part at the tip. The measuring terminal of the movable-type chip component measuring jig is connected to a measuring device by a flexible cable. The chip component is drawn by vacuum suction by the suction hole to bring the terminal of the chip component into contact with the measuring terminal and measure the chip component during its transfer.
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