发明名称 Process for fabricating thin film transistors
摘要 Transistors are formed by depositing at least one layer of semiconductor material on a substrate comprising a polyphenylene polyimide. The substrate permits the use of processing temperatures in excess of 300° C. during the processes used to form the transistors, thus allowing the formation of high quality silicon semiconductor layers. The substrate also has a low coefficient of thermal expansion, which closely matches that of silicon, thus reducing any tendency for a silicon layer to crack or delaminate.
申请公布号 US2002019081(A1) 申请公布日期 2002.02.14
申请号 US20010836884 申请日期 2001.04.17
申请人 DENIS KEVIN L.;CHEN YU;DRZAIC PAUL S.;JACOBSON JOSEPH M.;KAZLAS PETER T. 发明人 DENIS KEVIN L.;CHEN YU;DRZAIC PAUL S.;JACOBSON JOSEPH M.;KAZLAS PETER T.
分类号 H01L21/336;H01L29/786;(IPC1-7):H01L21/00;H01L21/84 主分类号 H01L21/336
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