发明名称 Measuring device to test the connection between at least two subassemblies
摘要 <p>The invention relates to a measuring device at least for testing the connections between at least two assemblies (3, 4, 5) having a test arrangement (1) for producing a test signal which is supplied to a test arrangement output and for evaluating an analysis signal which is supplied from an assembly (3, 4, 5), is formed from the test signal and is received at a test arrangement input. The test arrangement (1) is also provided for feeding a switching control signal to a control arrangement (10, 11, 12) contained on an assembly (3, 4, 5). An assembly (3, 4, 5) contains a switching device (7, 8, 9) which is controlled by the assigned control arrangement (10, 11, 12) and is provided for routing a test signal or an intermediate signal formed from the test signal to an assembly test input and for receiving at least one further intermediate signal from an assembly test output. A switching device (7, 8, 9) is provided, in a first switching state, for coupling the assembly test input to the test arrangement output and the assembly test output to an auxiliary connection (BR) and, in a second switching state, for coupling the assembly test input to an auxiliary connection (BR) and the assembly test output to the test arrangement input or to a further auxiliary connection (BR).</p>
申请公布号 EP0656590(B1) 申请公布日期 2002.02.13
申请号 EP19940203457 申请日期 1994.11.29
申请人 PHILIPS CORPORATE INTELLECTUAL PROPERTY GMBH;KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 MEYER, GERHARD DIPL.-ING.
分类号 H04B3/46;G01R31/04;G01R31/28;G01R31/3185;G06F11/22;(IPC1-7):G06F11/267;G01R31/318 主分类号 H04B3/46
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