| 摘要 |
PROBLEM TO BE SOLVED: To provide a test device for electric inspection for a semiconductor device provided with a compact contact probe pin without using a coillike spring. SOLUTION: An electric connection device is provided with a plunger 5 arranged in an end part having an opening 2 of a hollow and cylindrical electricity conducting member 3, slidable for an inner wall face of the cylindrical member and having electric conductivity, a contact part 4 protruding outward from a first face on an opening side of the plunger and having electric conductivity, a first magnetic substance whose magnetic pole on one side is fixed on a face on the opposite side to the first face of the plunger 5, and a second magnetic body 10 arranged in an end part on the other side of the hollow and cylindrical electricity conducting member 3. The contact part 4 can conduct electricity to a power supply through the plunger 5 and the hollow and cylindrical electricity conducting member 3, and the first magnetic body 7 and the second magnetic body 10 are arranged by making the same magnetic pole faces face each other in the cylindrical electricity conducting member 3.
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