| 摘要 |
<p>The invention relates to nuclear engineering, in particular to a method and a device for checking and examining a surface inside the experimental channels of nuclear and thermonuclear assemblies. Examination of the surface is carried out during a radiation and thereafter. Said examination is carried out for various operating regimes of a probe scanning microscope by selecting a probing device and a regime corresponding thereto. Afterwards, pictures of various surface characteristics thus obtained are analysed, making it possible to conclude with respect to the degree and dynamics of a radiation effect. The probe scanning microscope comprises a computer provided with a control plate and a measuring head of the probe scanning microscope. Said measuring head comprises a cylindrical body (1) fitted with abutments (4), a scanning unit, an electronic block (3), a data channel (2), a camera-recorder (5), lights (6) and a fixing mechanism.</p> |
