发明名称 METHOD FOR INSPECTING STAMP AND METHOD FOR INSPECTING SHEET FOR FORMING STAMP
摘要 PROBLEM TO BE SOLVED: To provide a method whereby stamps and sheets for forming stamps can be surely and speedily inspected and an acceptable range in terms of a quality can be arbitrarily determined. SOLUTION: There is provided the method for inspecting stamps which includes steps of irradiating a laser light while scanning in a predetermined direction to the stamps with a stamping face formed, measuring a shift amount after receiving the laser light reflected by the stamp with the use of a surveying device capable of measuring a physical change of the stamping face from a change of the laser light, and checking the presence/absence of defects by comparing reference data registered beforehand to a storage means with the measured data of the stamp. There is also provided the method for inspecting sheets for forming stamps which includes steps of irradiating a laser light while scanning in a predetermined direction to the sheet for forming stamps, measuring a shift amount after receiving the laser light reflected by the sheet with the use of a surveying device capable of measuring a physical change of a stamping face from a change of the laser light, and checking the presence/absence of defects by comparing reference data registered beforehand to a storage means with the measured data of the sheet.
申请公布号 JP2002039957(A) 申请公布日期 2002.02.06
申请号 JP20000225849 申请日期 2000.07.26
申请人 SHACHIHATA INC 发明人 FUJII HIDEKI;MIZUTANI KEIICHI;WATABE MITSUHIRO
分类号 G01B11/00;B41C1/00;G01B11/22;G01N21/95;G06T1/00 主分类号 G01B11/00
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