发明名称 THIN FILM CONDUCTOR LAYER, MAGNETORESISTIVE ELEMENT USING THE SAME AND METHOD OF PRODUCING THIN FILM CONDUCTOR LAYER
摘要 In a magnetoresistive element, deposition of a conductor layer in a DC magnetron sputtering apparatus causes application of tensile stress to the conductor layer, causing the problem of readily producing separation of the conductor layer. In the present invention, a conductor layer is formed so that the crystal face spacing in the direction perpendicular to the film plane is larger than the crystal face spacing of a bulk material. This permits application of compression stress to the conductor layer, preventing separation of the conductor layer.
申请公布号 US2002012206(A1) 申请公布日期 2002.01.31
申请号 US19990336300 申请日期 1999.06.21
申请人 KANNO HIROYUKI 发明人 KANNO HIROYUKI
分类号 C23C14/38;C23C14/14;G01R33/09;G11B5/39;G11B5/40;H01F10/30;H01F10/32;H01F41/30;H01L21/28;H01L21/285;H01L43/08;H01L43/12;(IPC1-7):G11B5/39 主分类号 C23C14/38
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