发明名称 PICK-UP EXAMINATION DEVICE
摘要 PURPOSE: A pick-up examination device is provided to reduce distortion of an output signal of a pick-up to be measured to improve accuracy in measurement and satisfies various measurement objects. CONSTITUTION: A pick-up examination device includes a driver(90) for driving an optical disc, a pick-up(120) for accessing the optical disc driven by the driver and outputting the signal, and a controller(100) for controlling the operations of the driver and pick-up. The device further has a converter for converting the output signal of the pick-up into a digital signal, a signal processor for processing the digital signal, and a signal analyzer(140) for judging if the pick-up is in normal stage or in abnormal state according to the output signal of the pick-up.
申请公布号 KR20020006912(A) 申请公布日期 2002.01.26
申请号 KR20000040449 申请日期 2000.07.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG, YEONG GI
分类号 G11B20/18;(IPC1-7):G11B7/12 主分类号 G11B20/18
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