发明名称 METHOD FOR TREATING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To diminish defects caused after development without increasing unevenness in the intrasurface dimensions of a substrate. SOLUTION: In a method for treating a substrate in which the disclosed surface of a substrate 11 to be worked is washed with pure water after a resist 12 exposed through an LSI pattern on the substrate 11 is developed with a TMAH developing solution, washing is carried out using ozonic water 17 containing 3 ppm dissolved gaseous ozone for 15 sec while turning the substrate 11 at 500 r.p.m. in the first washing step to degrade organic substances sticking to the disclosed surface of the substrate 11 and washing is carried out using hydrogenous water 18 containing 1.2 ppm dissolved gaseous hydrogen for 15 sec while turning the substrate 11 at 500 r.p.m. in the second washing step to remove the degraded organic substances from the substrate.
申请公布号 JP2002023386(A) 申请公布日期 2002.01.23
申请号 JP20000200252 申请日期 2000.06.30
申请人 TOSHIBA CORP 发明人 EMA TATSUHIKO;ITO SHINICHI
分类号 G03F7/32;G03F7/40;H01L21/027;H01L21/306;(IPC1-7):G03F7/32 主分类号 G03F7/32
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