| 摘要 |
PROBLEM TO BE SOLVED: To provide a serial access memory and a data-write/read-method in which a test time can be shortened. SOLUTION: After stored data of memory cells MC11-MCm1 connected to a word line WL1 are transferred simultaneously to read-registers Rreg-1 to Rreg-m, stored data of memory cells MC12-MCm2 connected to a word line WL2 are transferred simultaneously to write-registers Wreg-1 to Wreg-m. Data stored in the read-register is transmitted to an output means 123 through read- data buses RD,/RD. Data stored in the write-register is transmitted to an output means 123 through write-data buses WD, /WD, input/output means 122, and second read-data buses RD2, /RD2. The output means 123 compares data transmitted from the read-data buses RD, /RD with data transmitted from the second read-data buses RD2, /RD2.
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