发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a MOS transistor of which the leakage current is suppressed. SOLUTION: Formation of a region with an opposite polarity to that of a drain region and a higher impurity concentration than that of a well area of a MOS transistor in a lower part of the drain region of the MOS transistor, can suppress broadening of a depletion layer between the drain and the well toward the well side. Especially, since the broadening of the depletion layer in a lower part of the drain region toward the well side can be suppressed, the current flowing through a deeper path than the channel is suppressed effectively.
申请公布号 JP2002009283(A) 申请公布日期 2002.01.11
申请号 JP20010082214 申请日期 2001.03.22
申请人 SEIKO INSTRUMENTS INC 发明人 OMI TOSHIHIKO;ISHII KAZUTOSHI
分类号 H01L29/78;H01L21/8238;H01L27/092;H01L29/10;(IPC1-7):H01L29/78;H01L21/823 主分类号 H01L29/78
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