发明名称 Method of forming interlayer insulating film
摘要 A material containing, as a main component, an organic silicon compound represented by the following general formula: <paragraph lvl="0"><in-line-formula>R1xSi(OR2 )4-x </in-line-formula>(where R1 is a phenyl group or a vinyl group; R2 is an alkyl group; and x is an integer of 1 to 3) is caused to undergo plasma polymerization or react with an oxidizing agent to form an interlayer insulating film composed of a silicon oxide film containing an organic component. As the organic silicon compound where R1 is a phenyl group, there can be listed phenyltrimethoxysilane or diphenyldimethoxysilane. As the organic silicon compound where R1 is a vinyl group, there can be listed vinyltrimethoxysilane or divinyldimethoxysilane.
申请公布号 US2002004298(A1) 申请公布日期 2002.01.10
申请号 US20010900142 申请日期 2001.07.09
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 SUGAHARA GAKU;AOI NOBUO;ARAI KOJI;SAWADA KAZUYUKI
分类号 C23C16/26;C23C16/30;C23C16/40;H01L21/3105;H01L21/312;H01L21/314;H01L21/316;H01L21/768;(IPC1-7):H01L21/476;H01L21/31;H01L21/469 主分类号 C23C16/26
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