发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 In a manufacturing method of a thin-film transistor having a polycrystalline Si film as its active region, an amorphous-phase Si film is first formed, and pulse laser beams are irradiated to crystallize the Si film and thereby form a polycrystalline Si film. After electrodes are made on a source region and a drain region, a SiNx film as a hydrogen-containing film is formed on the entire surface. By irradiating pulse laser beams to heat the SiNx film, hydrogen in the SiNx film is diffused into the polycrystalline Si film to hydrogenate it and reduce the trap density along crystal grain boundaries in the polycrystalline Si film.
申请公布号 US2002004289(A1) 申请公布日期 2002.01.10
申请号 US19990362055 申请日期 1999.07.28
申请人 GOSAIN DHARAM PAL;USUI SETSUO 发明人 GOSAIN DHARAM PAL;USUI SETSUO
分类号 H01L21/268;H01L21/00;H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L29/786;H01S5/30;(IPC1-7):H01L21/84 主分类号 H01L21/268
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