发明名称 LOW-TEMPERATURE CHAMBER
摘要 PROBLEM TO BE SOLVED: To provide a low-temperature chamber in which a cause of malfunction in cooling and the like is made easy to ascertain by correctly grasping the content of the malfunction. SOLUTION: In the low temperature chamber, air is circulated by a cooling fan 3, and cooled by a combination 1 of a precool-stored cooling-device and a cool-storage medium, and the cool air is discharged from a cool-air outlet 9 to cool the chamber 7, and refrigerated articles are carried under cooling of the chamber. Temperature recorders 10 are attached in the vicinities of the outlet 9, the cool storage medium of the combination 1, and the open-air inlet part of a condenser 5, etc. The recorders 10 record temperature histories of the discharged cool air from the outlet 9, the cool-storage medium and the open air. When malfunction is generated in the low temperature chamber, a position of malfunction is located by checking the temperature histories.
申请公布号 JP2002005554(A) 申请公布日期 2002.01.09
申请号 JP20000185709 申请日期 2000.06.21
申请人 SANYO ELECTRIC CO LTD 发明人 IKEDA HIDEYA;KAWAGUCHI TAKESHI;NIIJIMA HIROSHI
分类号 F25D23/00;F25D11/00;F25D16/00;F25D29/00;(IPC1-7):F25D11/00 主分类号 F25D23/00
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