发明名称 Probe having micro-projection and manufacturing method thereof
摘要 A probe with a micro-projection for a near-field scanning optical microscope (NSOM) which comprises a substrate, first and second junction layers which are arranged on the substrate and electrically isolated from each other and which are made of an electroconductive material, and a micro-projection bonded to the substrate by way of the first and second junction layers and having a cavity in the inside. The micro-projection has first and second material layer made of different respective materials and laid one on the other to form a junction interlayer therebetween. The first and second material layers are electrically connected to the first and second junction layers respectively and independently.
申请公布号 US6337477(B1) 申请公布日期 2002.01.08
申请号 US19990353153 申请日期 1999.07.14
申请人 CANON KABUSHIKI KAISHA 发明人 SHIMADA YASUHIRO;YAGI TAKAYUKI;KURODA RYO
分类号 G01B7/34;G01B21/30;G01N37/00;G01Q30/02;G01Q60/22;(IPC1-7):G12B21/00;G12B21/02 主分类号 G01B7/34
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