发明名称 Method for manufacturing a semiconductor device
摘要 A method for manufacturing a semiconductor device separately forms two collector regions, two base extension regions, two base regions, and two collector extension regions on a first bipolar transistor forming region and a second bipolar transistor forming region that are formed on a semiconductor substrate, and includes a step of forming an emitter region on the first bipolar transistor region and forming, in the same process step, a base contact layer for an emitter electrode in the second bipolar transistor region as well, after which an emitter electrode is formed on the base contact layer.
申请公布号 US6333237(B1) 申请公布日期 2001.12.25
申请号 US20000531690 申请日期 2000.03.20
申请人 NEC CORPORATION 发明人 YOSHIDA HIROSHI
分类号 H01L29/73;H01L21/331;H01L21/8228;H01L27/082;H01L29/732;(IPC1-7):H01L21/822;H01L21/822;H01L21/823 主分类号 H01L29/73
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