摘要 |
PROBLEM TO BE SOLVED: To provide an infrared detecting element capable of improving the precision of temperature measurement while reducing the size and cost by the application of a thermopile form, and a thermometer using it. SOLUTION: This infrared detecting element comprises a semiconductor substrate, a thermopile formed on the main surface of the semiconductor substrate to generate a voltage on the basis of the temperature of a heat absorber for receiving infrared ray, and a reference temperature detecting means for detecting the reference temperature of the thermopile. The reference temperature detecting means has, as a thermosensitive part sensitive to the temperature change of the reference temperature, a plurality of semiconductor elements, whose the input and output characteristics are changed according to the temperature change to detect the reference temperature on the basis of the output from the semiconductor elements.
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