| 摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus which can fully, promptly and precisely analyze using an inexpensive and simple structure by preventing diffraction rays, which become interfering rays, from being generated on the side of the X-ray source in an apparatus for X-ray fluorescence analysis analyzing samples having crystal structures. SOLUTION: A filter 16, for causing transmittance of 1.2% or lower X-rays to be diffracted by the sample 1, which have the same wavelength as that of fluorescent X-rays 7 to be measured among X-rays 14 generated by an X-ray tube 13, is positioned between the X-ray tube 13 and the sample 1.
|
