发明名称 DEVICE AND METHOD FOR INSPECTION
摘要 A device and a method for inspection capable of eliminating the need of a pin coming in contact with a circuit wiring when inspection signals are fed to the circuit wiring and detecting visually unidentifiable micro defects; the inspection device (A) for inspecting the circuit wiring on a circuit board (100), comprising a conductive member (1) disposed on one surface side of the circuit board (100) and supplied with the inspection signals, a signal source (2) for feeding the inspection signals to the conductive member (1), a sensor unit (3) having a plurality of cells (3a) disposed on the other surface side of the circuit board (100) opposedly to the conductive member (1), and a computer (5) for acquiring the signals produced in each cell (3a) by feeding the inspection signals to the conductive member (1).
申请公布号 WO0196890(A1) 申请公布日期 2001.12.20
申请号 WO2001JP04993 申请日期 2001.06.13
申请人 OHT INC.;ISHIOKA, SHOGO;YAMAOKA, SHUJI 发明人 ISHIOKA, SHOGO;YAMAOKA, SHUJI
分类号 G01R31/02;G01N27/24;G01R31/28;G01R31/304;G01R31/312;H01L21/66;H05K3/00 主分类号 G01R31/02
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