发明名称 |
Apparatus and method of inspecting semiconductor integrated circuit |
摘要 |
Versatility of an inspection apparatus suitable for use in a burn-in inspection operation is improved so as to enable inspection of various semiconductor integrated circuits. A plurality of relay pins which are electrically connected to wiring patterns laid on a base board are provided. Sockets for receiving a semiconductor integrated circuits are mounted on a base board. An exchange board is provided for electrically connecting socket terminals of the socket to specific relay pins. The exchange board is mounted on the base board via spacers. In accordance with the type of semiconductor integrated circuits, the exchange board and the socket are replaced.
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申请公布号 |
US2001050569(A1) |
申请公布日期 |
2001.12.13 |
申请号 |
US20000730750 |
申请日期 |
2000.12.07 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
HASHIMOTO OSAMU;TANIMURA MASAAKI |
分类号 |
G01R31/26;G01R1/04;G01R1/06;G01R31/28;(IPC1-7):G01R31/02 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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