发明名称 Time domain reflectometry measurement instrument
摘要 A time domain reflectometry measuring instrument uses a microprocessor that provides added functionality and capabilities. The circuit electronics and probe are tested and calibrated at the factory. Installation and commissioning by the user is simple. The user installs the probe. The transmitter is attached to the probe. The user connects a standard shielded twisted pair to the electronics. Power is applied and the device immediately displays levels. A few simple parameters may need to be entered such as output characteristics and the process material dielectric constant.
申请公布号 US2001050629(A1) 申请公布日期 2001.12.13
申请号 US20010878895 申请日期 2001.06.11
申请人 BENWAY JOHN S.;PATTERSON DONALD R.;BERRY JAMES M. 发明人 BENWAY JOHN S.;PATTERSON DONALD R.;BERRY JAMES M.
分类号 G01F23/284;G01S13/00;G01S13/88;(IPC1-7):G01S13/08 主分类号 G01F23/284
代理机构 代理人
主权项
地址