发明名称 VARIABLE DELAY CIRCUIT AND SEMICONDUCTOR CIRCUIT TESTING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a variable delay circuit which is reduced in circuit scale by decreasing the amount of data of a table for control of the variable delay circuit. SOLUTION: The variable delay circuit 60 has a delay circuit part group 20, a control part 30, and an offset delay quantity storage part group 40. The delay circuit part group 20 has plural delay circuit parts 22, which have two paths with different delay quantities. The offset delay quantity storage part group 40 has offset delay quantity storage parts 44, in which offset delay quantities corresponding to the delay quantities of the 1st paths of the delay circuit parts 22 are set. The control part 30 has plural subtraction parts 34, which calculate delay set values 12 and offset delay quantities to select a path of a delay circuit part 22 that an input signal 10 passes through. The path is selected through the operation, so the need to prepare a table is eliminated to reduce the circuit scale.</p>
申请公布号 JP2001339282(A) 申请公布日期 2001.12.07
申请号 JP20000160083 申请日期 2000.05.30
申请人 ADVANTEST CORP 发明人 MIKAMI HIROYUKI;TSURUKI YASUTAKA
分类号 G01R31/28;G01R31/3193;H03K5/13;(IPC1-7):H03K5/13 主分类号 G01R31/28
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