| 摘要 |
PROBLEM TO BE SOLVED: To realize a semiconductor memory element capable of analyzing its malfunction in a fast actual operation state even by using a simple testing system. SOLUTION: The semiconductor memory element is provided with a DFM register 16 for temporarily storing pin setting information on input/output pins of the element, and a test control circuit 15 for controlling the DFM register 16 so that the pin setting information is stored therein by the setting from the outside and the stored pin setting information is read out from the DFM register 16 by the setting from the outside.
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