发明名称 DEVICE FOR AUTOMATICALLY SETTING MEASUREMENT CONDITION OF SURFACE ROUGHNESS STATE MEASURING MACHINE
摘要 PROBLEM TO BE SOLVED: To inexpensively provide a measurement condition setting device capable of easily setting a condition for measuring a surface roughness state. SOLUTION: This device is provided with an input means 21 for allowing an operator to specify a measurement type and computation standards, a display part for displaying various relevant parameters, a parameter setting part 23 for setting the required and specified parameter of the above ones, and a cut-off value setting part 26 for automatically setting a cut-off value according to the specified parameter and the parameter value calculated from the measured data when the measurement (tentative measurement) of a workpiece is executed after that.
申请公布号 JP2001336928(A) 申请公布日期 2001.12.07
申请号 JP20010170690 申请日期 2001.06.06
申请人 TOKYO SEIMITSU CO LTD 发明人 KUME SHIGEFUMI
分类号 G01B21/30;(IPC1-7):G01B21/30 主分类号 G01B21/30
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