发明名称 TEST MODE SELECTION CIRCUIT FOR MICROCONTROLLER
摘要 The invention relates, in a video decoder, to a method of switching from a first to a second coded video sequence when the second bit rate is lower than the first one. If the time spent in the decoder's buffer by the first bit of the first transmitted picture of the second sequence that has to be decoded, also called vbv_ delay, is greater - and therefore not compatible with - than the similar period for the first bit of the first replaced picture of the first sequence, it is then reduced by giving to the bit rate of said first transmitted picture an increased value, in order to obtain the compatibility of the vbv_ delays. In case of a limited bandwidth for the bit rates, this reduction operation is successively repeated for as many following pictures as necessary.
申请公布号 KR20010105939(A) 申请公布日期 2001.11.29
申请号 KR20000027069 申请日期 2000.05.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JONG CHEOL
分类号 G06F11/22 主分类号 G06F11/22
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