发明名称 |
Termination circuits and methods therefor |
摘要 |
An active termination circuit for protecting a node against an ESD voltage spike is described. The ESD protection circuit includes a bottom ESD protection transistor having a first node coupled to a first potential and a bottom ESD protection transistor intrinsic diode reverse biasedly coupling said node to a first reference voltage supply and a bottom threshold reference transistor coupled to the first reference voltage supply. The bottom threshold reference transistor provides a first bias voltage to the bottom ESD protection transistor gate that biases the bottom clamping transistor gate at about a first threshold voltage from the first reference voltage representing a threshold voltage of said bottom ESD protection transistor. The circuit also includes a top ESD protection transistor having a second node coupled to a second potential and a top ESD protection transistor intrinsic diode reverse biasedly coupling the node to a second reference voltage supply and a top threshold reference transistor coupled to the second reference voltage supply. The top threshold reference transistor provides a second bias voltage to the top ESD protection transistor gate that biases the top clamping transistor gate at about a second threshold voltage below the second reference voltage that represents a threshold voltage of said top ESD protection transistor.
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申请公布号 |
US6323676(B1) |
申请公布日期 |
2001.11.27 |
申请号 |
US20000706239 |
申请日期 |
2000.11.02 |
申请人 |
CALIFORNIA MICRO DEVICES CORPORATION |
发明人 |
WHITWORTH ADAM J.;RICHIUSO DOMINICK |
分类号 |
H04L25/02;(IPC1-7):H03K17/16;H02H9/00 |
主分类号 |
H04L25/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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