发明名称 Power field-effect transistor having a trench gate electrode and method of making the same
摘要 A technique is provided which makes it possible to reduce the area of a power MOSFET (1) of the trench type in which a source region (27) is exposed on both of a substrate top surface (51) and a sidewall (52) of a trench (18). Since this makes it possible to provide contact between the source region (27) and a source electrode (29) not only on the substrate top surface (51) but also on the sidewall (52) of the trench (18), source contact is provided with a sufficiently low resistance and the area of the device can be made smaller. <IMAGE>
申请公布号 EP1085577(A3) 申请公布日期 2001.11.21
申请号 EP20000119844 申请日期 2000.09.12
申请人 SHINDENGEN ELECTRIC MANUFACTURING COMPANY, LIMITED 发明人 TAKEMORI, TOSHIYUKI;WATANABE, YUJI
分类号 H01L21/336;H01L29/417;H01L29/739;H01L29/78 主分类号 H01L21/336
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