发明名称 |
Power field-effect transistor having a trench gate electrode and method of making the same |
摘要 |
A technique is provided which makes it possible to reduce the area of a power MOSFET (1) of the trench type in which a source region (27) is exposed on both of a substrate top surface (51) and a sidewall (52) of a trench (18). Since this makes it possible to provide contact between the source region (27) and a source electrode (29) not only on the substrate top surface (51) but also on the sidewall (52) of the trench (18), source contact is provided with a sufficiently low resistance and the area of the device can be made smaller. <IMAGE> |
申请公布号 |
EP1085577(A3) |
申请公布日期 |
2001.11.21 |
申请号 |
EP20000119844 |
申请日期 |
2000.09.12 |
申请人 |
SHINDENGEN ELECTRIC MANUFACTURING COMPANY, LIMITED |
发明人 |
TAKEMORI, TOSHIYUKI;WATANABE, YUJI |
分类号 |
H01L21/336;H01L29/417;H01L29/739;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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