发明名称 APPARATUS AND METHOD FOR INSPECTION OF ELECTRO-OPTICAL DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To surely and efficiently detect the defect of a drive circuit inside a liquid crystal device. SOLUTION: A detection part which detects the power-supply current value of the drive circuit inside the liquid crystal device as an object to be inspected is provided. A judgment part which judges whether the defect of the drive circuit exists or not on the basis of the output of the detection part is provided. The judgment part detects the latent defect of an active element in the drive circuit by detecting the abnormal place of a change in the current value within one data write cycle.</p>
申请公布号 JP2001318113(A) 申请公布日期 2001.11.16
申请号 JP20000134571 申请日期 2000.05.08
申请人 SEIKO EPSON CORP 发明人 KUBOTA SHIGERU
分类号 G01R31/00;G02F1/13;G02F1/136;G02F1/1368;G09F9/00;(IPC1-7):G01R31/00 主分类号 G01R31/00
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