发明名称 A METHOD TO MEASURE SURFACE STRUCTURE
摘要 <p>For measuring a surface structure, one takes two or more pictures with a progressive-scan CCD camera (15) and drag light from different directions for different pictures. A two-dimensional Fourier transform is then carried out for each picture and the two spectra are added to form a spectrum that is an approximation of the correct spectrum for the surface that is photographed. This spectrum illustrates the surface structure. The method can be carried out on-line in a paper machine and the result will be as good as the result of conventional laboratory tests.</p>
申请公布号 WO2001086228(A1) 申请公布日期 2001.11.15
申请号 SE2001000974 申请日期 2001.05.04
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