发明名称 |
METHOD FOR FORMING METAL FILM OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A metal film formation method is provided to entirely and easily fill a metal material into a contact hole and to simplify manufacturing process by using a plasma etching. CONSTITUTION: A first barrier layer(34) and a second barrier layer(36a) are sequentially formed on an insulating pattern(32) having a contact hole. The surface of the second barrier layer(36a) is then planarized by using a plasma etching. After forming a metal film(38) used as a metal interconnection on the second barrier layer(36a), the metal film(38) is entirely filled into the contact hole by performing reflow process at a high temperature.
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申请公布号 |
KR20010095589(A) |
申请公布日期 |
2001.11.07 |
申请号 |
KR20000018845 |
申请日期 |
2000.04.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SON, IN SU |
分类号 |
H01L21/283;(IPC1-7):H01L21/283 |
主分类号 |
H01L21/283 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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