发明名称 METHOD FOR FORMING METAL FILM OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A metal film formation method is provided to entirely and easily fill a metal material into a contact hole and to simplify manufacturing process by using a plasma etching. CONSTITUTION: A first barrier layer(34) and a second barrier layer(36a) are sequentially formed on an insulating pattern(32) having a contact hole. The surface of the second barrier layer(36a) is then planarized by using a plasma etching. After forming a metal film(38) used as a metal interconnection on the second barrier layer(36a), the metal film(38) is entirely filled into the contact hole by performing reflow process at a high temperature.
申请公布号 KR20010095589(A) 申请公布日期 2001.11.07
申请号 KR20000018845 申请日期 2000.04.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SON, IN SU
分类号 H01L21/283;(IPC1-7):H01L21/283 主分类号 H01L21/283
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