发明名称 |
METHOD FOR FABRICATING STACKED DOUBLE POLYSILICON/MOS CAPACITOR USING SiGe INTEGRATION |
摘要 |
PURPOSE: A method for fabricating stacked double polysilicon/mos capacitor using SiGe integration is provided to improve capacitance per unit area. CONSTITUTION: A region of a first conductivity-type(12) is formed in a surface of a semiconductor substrate(10). A gate oxide is formed on the semiconductor substrate overlaying the region of first conductivity-type. A first polysilicon layer(18) is formed at least on the gate oxide layer and the first polysilicon layer is doped with an N or P-type dopant. A dielectric layer is formed on the first polysilicon layer. A second polysilicon layer(22) is formed on the dielectric layer and the second polysilicon layer is doped with the same or different dopant as the first polysilicon layer.
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申请公布号 |
KR20010096611(A) |
申请公布日期 |
2001.11.07 |
申请号 |
KR20010013529 |
申请日期 |
2001.03.16 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
COOLBAUGH DOUGLAS D.;DUNN JAMES STUART;ST. ONGE STEPHEN ARTHUR |
分类号 |
H01L27/04;H01L21/02;H01L21/822;H01L21/8249;H01L27/06;H01L29/94;(IPC1-7):H01L27/06 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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