发明名称 METHOD FOR FABRICATING STACKED DOUBLE POLYSILICON/MOS CAPACITOR USING SiGe INTEGRATION
摘要 PURPOSE: A method for fabricating stacked double polysilicon/mos capacitor using SiGe integration is provided to improve capacitance per unit area. CONSTITUTION: A region of a first conductivity-type(12) is formed in a surface of a semiconductor substrate(10). A gate oxide is formed on the semiconductor substrate overlaying the region of first conductivity-type. A first polysilicon layer(18) is formed at least on the gate oxide layer and the first polysilicon layer is doped with an N or P-type dopant. A dielectric layer is formed on the first polysilicon layer. A second polysilicon layer(22) is formed on the dielectric layer and the second polysilicon layer is doped with the same or different dopant as the first polysilicon layer.
申请公布号 KR20010096611(A) 申请公布日期 2001.11.07
申请号 KR20010013529 申请日期 2001.03.16
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 COOLBAUGH DOUGLAS D.;DUNN JAMES STUART;ST. ONGE STEPHEN ARTHUR
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8249;H01L27/06;H01L29/94;(IPC1-7):H01L27/06 主分类号 H01L27/04
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