发明名称 Method and apparatus for measuring parameters of an electronic system, for example MTIE
摘要 <p>Timing errors in digital transmission systems such as MTIE (340) in Synchronous Digital Hierarchy (SDH) systems are measured with data samples (225) processed in a first stage (260) to produce in real-time a first, time-varying series of measurements (300) for a given parameter over observation intervals of a first magnitude, each observation interval being many times longer than the sample period of the input series. Subsequent stages (280, 280') derive further series of measurements, corresponding to increasingly longer observation intervals, derived by treating previous observation intervals as sub-intervals. The first stage (260) derives intermediate results for a pre-determined interval and repeats for successive sub-intervals, the intermediate results stored in a first first-in, first-out (FIFO) data set (300) and updated at least once per sub-interval and the required parameter derived (335). The second and subsequent stages (280, 280') similarly derive the required parameter corresponding to increasing magnitudes of observation interval and updates said measurements as data sets update. &lt;IMAGE&gt;</p>
申请公布号 EP1152562(A1) 申请公布日期 2001.11.07
申请号 EP20000303669 申请日期 2000.05.02
申请人 AGILENT TECHNOLOGIES, INC. (A DELAWARE CORPORATION) 发明人 BALLANTYNE, ALEX;TAYLOR, DAVID FINLAY
分类号 G01R29/02;H04J3/00;H04J3/06;H04J3/14;H04L1/20;H04L1/24;H04L7/00;(IPC1-7):H04L1/20 主分类号 G01R29/02
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