发明名称 INSPECTION METHOD AND INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an inspection method and an inspection device for enabling more accurate inspections to an inspection object changing everyday. SOLUTION: An image pickup part 1 inputs the image of the inspection object as image data, a data input part 2 tentatively stores the image data inputted by the image pickup part 1 and a feature amount calculation part 3 calculates the feature amount of the image data inside the data input part 2 by using dictionary data inside a dictionary storage part where the dictionary data are stored beforehand. A decision part 4 judges the acceptance or rejection of the inspection object on the basis of the feature amount calculated by the feature amount calculation part 3 and a data gathering part 5 gathers the image data of a new defective inspection object by using the image pickup part 1. A dictionary preparation part 6 prepares new dictionary data by using the image data gathered by the data gathering part 5 and registers the prepared new dictionary data in the dictionary storage part inside the feature amount calculation part 3.
申请公布号 JP2001307100(A) 申请公布日期 2001.11.02
申请号 JP20000122927 申请日期 2000.04.24
申请人 TOSHIBA CORP 发明人 HASHIYA SEIICHI
分类号 G01N21/892;G06T1/00;G06T7/00 主分类号 G01N21/892
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