发明名称 METHOD OF MAKING A PROBE TEST BOARD
摘要 A universal design of a multiple layer printed circuit board incorporates a series of routing vias (51, 52, 53, 54) interconnecting a series of entry vias (30a, 30b, 30c, 30d) with a series of exit vias (34a, 34b, 34c, 34d). The routing vias connect all of the entry vias to all of the exit vias through junctions (a, b, c, d) spaced on the routing vias. The exit vias are located on a central portion (38) of the board having a copper coating on one side. The junctions are located on the via so that junctions may be selectively severed by means of a laser or high pressure water cutting system or other fine line cutting tool or mechanism to customize the circuit design for a particular semiconductor device or integrated circuit. Traces (58) are created leading from the exit vias (34) to probe pin contact points (62) by cutting through the copper coating using similar fine line cutting tools.
申请公布号 WO0179867(A1) 申请公布日期 2001.10.25
申请号 WO2000US09710 申请日期 2000.04.12
申请人 WENTWORTH LABORATORIES, INC. 发明人 EVANS, STEPHEN;MARTEL, A., PAUL
分类号 G01R1/073;H05K1/00;H05K3/42;(IPC1-7):G01R1/073 主分类号 G01R1/073
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