发明名称 Aligner and method for inspecting semiconductor wafer using shell
摘要 An aligner according to the present invention is constituted by integrating a wafer chuck, a wafer and a contactor, which are aligned with one another, into one piece by vacuum adsorptivity. A vacuum exhaust apparatus for generating the vacuum adsorptivity, includes first and second valve mechanisms, a valve operation mechanism for opening/closing these valve mechanisms, first and second solenoid valves connected to the valve operation mechanism through a vacuum exhaust line, and a vacuum leak detecting pressure gauge interposed between the first solenoid valve and the valve operation mechanism.
申请公布号 US6307390(B1) 申请公布日期 2001.10.23
申请号 US19990288291 申请日期 1999.04.08
申请人 TOKYO ELECTRON LIMITED 发明人 AKAIKE YUTAKA;KONO ISAO;SANO SATOSHI
分类号 H01L21/68;G01R31/26;G01R31/28;H01L21/66;H01L21/683;(IPC1-7):G01R31/02 主分类号 H01L21/68
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