发明名称 METHOD AND DEVICE FOR VISUAL INSPECTION
摘要 PROBLEM TO BE SOLVED: To provide a visual inspection method having high inspection processing speed. SOLUTION: This visual inspection method is provided with a means (a) of providing image data prepared by picking up the image of an object to be inspected, a means (b) of finding brightness of each of plural image units forming the image data based on the image data, a means (c) of finding the number of the image unit which have the same brightness each other for every brightness, a means (d) of finding the maximum number na among those plural numbers found for each brightness level as an actually measured maximum number, a means (e) of computing by using the actually measured maximum number and finding the set maximum number n'a as a result of the computation, a means (f) of finding the threshold level of the brightness level, based on the maximum number set, a means (g) of binarizing the image data based on the threshold level, and a means (h) of detecting defect of the object to be inspected, based on the binarized image data.
申请公布号 JP2001289792(A) 申请公布日期 2001.10.19
申请号 JP20000105369 申请日期 2000.04.06
申请人 NEC CORP 发明人 SASAKI YOSHIHIRO;NAGAO MASAHIKO
分类号 G01N21/95;G01N21/956;G06T1/00;G06T5/00;G06T7/00 主分类号 G01N21/95
代理机构 代理人
主权项
地址